Search results for: R. Heller
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 59 - 63
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 78 - 83
IEEE Electron Device Letters > 2016 > 37 > 7 > 902 - 905
IEEE Transactions on Electron Devices > 2016 > 63 > 7 > 2742 - 2748
IEEE Transactions on Applied Superconductivity > 2016 > 26 > 4 > 1 - 6
IEEE Transactions on Applied Superconductivity > 2016 > 26 > 4 > 1 - 5
IEEE Transactions on Applied Superconductivity > 2016 > 26 > 4 > 1 - 5
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1459 - 1463
IEEE Transactions on Applied Superconductivity > 2016 > 26 > 2 > 69 - 77
IEEE Transactions on Applied Superconductivity > 2014 > 24 > 3 > 1 - 6
IEEE Transactions on Applied Superconductivity > 2014 > 24 > 3 > 1 - 4
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3145 - 3151
IEEE Transactions on Applied Superconductivity > 2014 > 24 > 3 > 1 - 5
IEEE Transactions on Electron Devices > 2013 > 60 > 1 > 159 - 162
IEEE Transactions on Electron Devices > 2013 > 60 > 6 > 1898 - 1904
IEEE Transactions on Applied Superconductivity > 2012 > 22 > 3 > 4200304
2011 International Reliability Physics Symposium > CD.2.1 - CD.2.5