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Thin films of ZnO were deposited on cleaned soda lime glass substrates by using RF magnetron sputtering technique for deposition time of 20mins, 40mins, 60mins, 80mins and 100mins at room temperature. The structural and electrical properties of ZnO thin films were obtained from X-ray diffraction (XRD), Atomic force microscopy (AFM) and Hall Effect measurement. XRD results confirm the presence of (002)...
Firstly, Cadmium Telluride (CdTe) thin films have been deposited on cleaned soda lime glass substrates at 300°C by using the RF magnetron sputtering technique. After that, Cu thin film was deposited for 5 minutes at 200°C on top of CdCl2 treated CdTe thin films by sputtering. Subsequently, CdTe and Cu stacks were annealed at 400°C for 15 minutes, 20 minutes and 25 minutes in a vacuum furnace. The...
Laser annealing of CdTe thin films with two different wavelengths has been studied in this work. The CdTe thin films were grown by thermal evaporation at a deposition current of 28A and then subjected to post deposition laser annealing at two different wavelengths of 532nm (green) and 1064nm + 532nm (infrared + green). The other parameters like laser output energy, stage velocity and pulse repetition...
Cadmium Telluride thin films have been deposited on FTO coated glass substrates by using the sputtering and thermal evaporation technique. CdTe thin film was firstly grown by sputtering at a substrate temperature 300°C, as well as CdTe thin film was also deposited by thermal evaporation technique. The grown films from both processes were annealed in a vacuum furnace of nitrogen ambient at pressure...
Cadmium Zinc Telluride (CZT) films were deposited by co-sputtering of CdTe and ZnTe targets in an RF magnetron sputtering using various combinations of RF powers, and the effect of sputtering power on the properties of CZT films were studied using SEM, EDX, XRD, AFM and UV-VIS spectrophotometer. The SEM and AFM data shows that as the ratio of the CdTe: ZnTe RF power increases, so does the grains size...
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