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Thin films of ZnO were deposited on cleaned soda lime glass substrates by using RF magnetron sputtering technique for deposition time of 20mins, 40mins, 60mins, 80mins and 100mins at room temperature. The structural and electrical properties of ZnO thin films were obtained from X-ray diffraction (XRD), Atomic force microscopy (AFM) and Hall Effect measurement. XRD results confirm the presence of (002)...
Laser annealing of CdTe thin films with two different wavelengths has been studied in this work. The CdTe thin films were grown by thermal evaporation at a deposition current of 28A and then subjected to post deposition laser annealing at two different wavelengths of 532nm (green) and 1064nm + 532nm (infrared + green). The other parameters like laser output energy, stage velocity and pulse repetition...
Cadmium Zinc Telluride (CZT) films were deposited by co-sputtering of CdTe and ZnTe targets in an RF magnetron sputtering using various combinations of RF powers, and the effect of sputtering power on the properties of CZT films were studied using SEM, EDX, XRD, AFM and UV-VIS spectrophotometer. The SEM and AFM data shows that as the ratio of the CdTe: ZnTe RF power increases, so does the grains size...
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