Search results for: S. Wang
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 22 - 34
IEEE Electron Device Letters > 2008 > 29 > 5 > 483 - 486
IEEE Electron Device Letters > 2007 > 28 > 10 > 909 - 912
IEEE Electron Device Letters > 2006 > 27 > 11 > 914 - 916