Search results for: J. Meyer
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3114 - 3119
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 474 - 477
IEEE Electron Device Letters > 2014 > 35 > 5 > 527 - 529
IEEE Electron Device Letters > 2013 > 34 > 2 > 199 - 201