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The Single Event Burnout sensitive volume of power MOSFETs is investigated using the laser Two-Photon Absorption Technique. A first discussion about the efficiency of this technique is given.
Linear and two-photon laser testing is used to investigate the single-event latchup sensitive depth of SRAM CY7C1069 embedded in CARMEN satellite experiment. Results are discussed and compared with heavy ion and flight data.
Laser stimulation techniques are continuously developed in accordance with the apparition of new kind of defect. We propose the full dynamic laser stimulation where the test is fully embedded in the localization process. By using a modulated laser instead of a continuous one we discriminate vectors fail in addition to localization.
The soft defect localization on analog or mixed-mode ICs is becoming more and more challenging due to their increasing complexity and integration. New techniques based on dynamic laser stimulation are promising for analog and mixedmode ICs. Unfortunately, the considerable intrinsic sensitivity of this kind of devices under laser stimulation makes the defect localization results complex to analyze...
Dynamic laser stimulation techniques have been developed with success for failure analysis of integrated circuit subjected to ldquosoft defectrdquo. Weakness in design and physical defect can be isolated and located through these methodologies for digital, analog and mixed mode devices. But they are now successfully used embedded in qualification process since they provide accurate information about...
This paper presents principles and results of dynamic testing of an SRAM-based FPGA using time- resolved fault injection with a pulsed laser. The synchronization setup and experimental procedure are detailed. Fault injection results obtained with a DES crypto-core application implemented on a Xilinx Virtex II are discussed.
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