Search results for: Ting-Chang Chang
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3167 - 3173
IEEE Electron Device Letters > 2017 > 38 > 7 > 835 - 838
IEEE Electron Device Letters > 2017 > 38 > 6 > 705 - 707
IEEE Electron Device Letters > 2017 > 38 > 5 > 592 - 595
IEEE Electron Device Letters > 2017 > 38 > 4 > 469 - 472
IEEE Electron Device Letters > 2017 > 38 > 3 > 334 - 337
IEEE Electron Device Letters > 2016 > 37 > 8 > 1010 - 1013
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 20 - 24
IEEE Electron Device Letters > 2016 > 37 > 2 > 228 - 230
IEEE Electron Device Letters > 2015 > 36 > 10 > 1050 - 1052
IEEE Transactions on Electron Devices > 2014 > 61 > 6 > 2119 - 2124
IEEE Electron Device Letters > 2014 > 35 > 6 > 651 - 653
IEEE Electron Device Letters > 2013 > 34 > 5 > 638 - 640
IEEE Electron Device Letters > 2013 > 34 > 1 > 63 - 65
Solid State Electronics > 2012 > 69 > Complete > 11-13
IEEE Electron Device Letters > 2012 > 33 > 7 > 1000 - 1002
IEEE Electron Device Letters > 2012 > 33 > 3 > 303 - 305
IEEE Electron Device Letters > 2012 > 33 > 4 > 540 - 542