Search results for: B. Li
2016 IEEE International Reliability Physics Symposium (IRPS) > 3A-5-1 - 3A-5-8
2016 IEEE International Reliability Physics Symposium (IRPS) > DI-4-1 - DI-4-3
Theoretical and Applied Fracture Mechanics > 2015 > 80 > PA > 14-21
Procedia Engineering > 2014 > 89 > Complete > 386-394
2013 IEEE International Electron Devices Meeting > 15.3.1 - 15.3.4
Microelectronic Engineering > 2012 > 92 > Complete > 79-82
IEEE Electron Device Letters > 2012 > 33 > 4 > 588 - 590
IEEE Electron Device Letters > 2012 > 33 > 7 > 1051 - 1053
2011 International Reliability Physics Symposium > 2A.1.1 - 2A.1.6
IEEE Electron Device Letters > 2011 > 32 > 2 > 200 - 202
IEEE Electron Device Letters > 2011 > 32 > 6 > 806 - 808
2010 International Electron Devices Meeting > 33.5.1 - 33.5.4
IEEE Electron Device Letters > 2010 > 31 > 4 > 347 - 349