Search results for: A. Kobayashi
IEEE Transactions on Nuclear Science > 2006 > 53 > 4-1 > 1794 - 1798
IEEE International Conference on Test, 2005. > 10 pp. - 1154
IEEE Transactions on Nuclear Science > 2006 > 53 > 4-1 > 1794 - 1798
IEEE International Conference on Test, 2005. > 10 pp. - 1154