Search results for: Keiko Abe
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 427 - 431
2016 IEEE International Electron Devices Meeting (IEDM) > 27.5.1 - 27.5.4
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 427 - 431
2016 IEEE International Electron Devices Meeting (IEDM) > 27.5.1 - 27.5.4