Search results for: Umesh
IEEE Access > 2017 > 5 > 10232 - 10240
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3665 - 3670
2015 IEEE International Reliability Physics Symposium > 6C.1.1 - 6C.1.6
IEEE Electron Device Letters > 2014 > 35 > 10 > 1019 - 1021