The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Investigation of the structure of graphene layers onto silicon dioxide and its relations with carriers transport mechanism is reported. It has been shown that CVD graphene has granular structure. Potential barriers at the grain boundaries hinder the transport of carriers. Experimental result shows, that electron beam irradiation leads to injection of extra charges into silicon dioxide layer, creating...
In this work charge trapping and electroluminescence (EL) quenching in rare‐earth (RE) implanted SiO2 on Si as a function of injected charge into the dielectric were studied. The blocking of the luminescent REOX nanoclusters from the hot exciting electrons by negative charge trapping in a defect region (shell) located in the vicinity of the REOX nanocluster/SiO2 interface is considered as the main...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.