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The development of reflectance difference (RD/RA) spectroscopy as a powerful optical probe for characterizing surfaces and interfaces has suggested that an extension to microscopic scale (micro‐RD) could further increase the potential of the technique. In their article on pp. 1119–1123, Lastras‐Martínez et al. compare and discuss the performance of two setups used to measure micro‐RD. One is based...
Micro reflectance difference spectroscopy (µ‐RDS) is a promising tool for the in‐situ and ex‐situ characterization of semiconductors surfaces and interfaces. We discuss and compare two different approaches used to measure µ‐RD spectra. One is based on a charge‐coupled device (CCD) camera, while the other uses a laser and a XY translation stage. To show the performance of these systems, we have measured...
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