Search results for: Yu Lin
IEEE Electron Device Letters > 2017 > 38 > 6 > 712 - 715
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 688 - 690
IEEE Electron Device Letters > 2016 > 37 > 11 > 1387 - 1390
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 531 - 536
IEEE Electron Device Letters > 2014 > 35 > 4 > 467 - 469
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 173 - 179
IEEE Transactions on Electron Devices > 2010 > 57 > 7 > 1636 - 1641
IEEE Transactions on Electron Devices > 2010 > 57 > 3 > 665 - 670