Search results for: H. Kim
2015 IEEE International Reliability Physics Symposium > 6A.3.1 - 6A.3.5
IEEE Transactions on Circuits and Systems I: Regular Papers > 2012 > 59 > 3 > 584 - 593
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 6 > 947 - 956