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Memory cores usually occupy a significant portion of the chip area of a complex system-on-chip. Thus, the yield of memory cores dominates the yield of the chip. Diagnosis and repair are two important techniques for memory yield improvement. In this paper, we propose two efficient diagnosis algorithms for drowsy static random access memories (SRAMs). The first diagnosis algorithm, March D2, can be...
Complex system-on-a-chip (SOC) designs usually consist of many memory cores. Efficient yield-enhancement techniques thus are required for the memory cores in SOCs. This paper presents an infrastructure intelligent property (IIP) for testing, diagnosing, and repairing multiple memory cores in SOCs. The proposed IIP can perform parallel testing for multiple memories, and serial diagnosis or repair for...
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