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Due to customer's different knowledge background and interests, the demand information is different on presentation and content. A unified information model is built up to standardize information, which includes the demand framework, the effective demand item and the basic desirous function. Based on the information similarity, a fusion method is given to synthesize incomplete information. The steps...
On-chip linear decompression-based schemes have been widely adopted by industrial circuits nowadays to effectively reduce the ever increasing test data volume and test time. Though they can easily achieve relatively high compression ratio, there is a bound of effective compression ratio for these compression schemes. Prior work tried to address this problem by trying different compression architectures...
This paper proposes to provide testability for the breaking point produced by the Through-Silicon-Vias (TSVs) of 3D-Stacked ICs (3D-SICs) during pre-bond testing with low Design-for-Testability (DfT) cost. Different from prior solutions which utilize two additional wrapper cells for the breaking point at each TSV, this paper proposes to provide the testability of two ends of the TSVs respectively...
Test power, volume, and time are the major test cost parameters that must be minimized while achieving the desired level of fault coverage. Unlike prior research in delay fault testing that has focused on at most two test cost parameters, the hybrid (LOS+LOC) scheme proposed here simultaneously considers all three cost parameters and achieves better fault coverage than prior schemes, as demonstrated...
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