Search results for: Ke Li
Microelectronics Reliability > 2018 > 87 > C > 57-63
IEEE Transactions on Microwave Theory and Techniques > 2016 > 64 > 8 > 2409 - 2422
IEEE Transactions on Electron Devices > 2013 > 60 > 12 > 4252 - 4257
IEEE Transactions on Microwave Theory and Techniques > 2012 > 60 > 4 > 938 - 944
IEEE Antennas and Wireless Propagation Letters > 2003 > 2 > 1 > 194 - 196