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In ADC BIST testing circuit, ramp signal is the most widely used stimulus because of its simple structure and ease of control. In addition, with SEIR algorithm, the linearity requirement of the ramp signal is highly relaxed. But for high resolution ADC BIST testing, the ramp signal must be repetitive for acquiring valid data because a single ramp will cost large area, which is not acceptable for BIST...
A calibration technique for SAR analog-to-digital converters is proposed in this paper which is ready to be integrated on chip. This technique is based on the integral nonlinearity (INL) test and utilizes one redundant bit and extra two quantization bits to improve the calibration accuracy. In the calibration mode, mismatch errors are saved as higher-bit level INL information and then translated to...
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