Search results for: Yi Chen
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 10 - 14
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 2944 - 2951
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 10 - 14
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 2944 - 2951