Search results for: G. Schneider
Ultramicroscopy > 2011 > 111 > 12 > 1706-1711
Microelectronic Engineering > 2010 > 87 > 5-8 > 1557-1560
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 1 > 20 - 30
Micro&Nano Letters > 2007 > 2 > 1 > 1 - 5
Nuclear Inst. and Methods in Physics Research, A > 2001 > 467-468 > Part 2 > 1308-1311
Nuclear Inst. and Methods in Physics Research, A > 2001 > 467-468 > Part 2 > 857-860
Nuclear Inst. and Methods in Physics Research, A > 2001 > 467-468 > Part 2 > 849-852
Nuclear Inst. and Methods in Physics Research, A > 2001 > 467-468 > Part 2 > 1312-1314
Nuclear Inst. and Methods in Physics Research, A > 2001 > 467-468 > Part 2 > 877-880
Journal of Structural Biology > 2000 > 132 > 2 > 123-132
Ultramicroscopy > 2000 > 84 > 3-4 > 185-197
Microelectronic Engineering > 1996 > 32 > 1-4 > 351-367