The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Based on the electro-mechanical impedance technology, experiments were carried out to study the damage identification. A precise impedance analyzer HP4294A was used to extract electricity admittance from free piezoelectric (PZT) patches to analyze the characteristics. And extract and analyze electricity admittance from PZT patch on the steel beam with original undamaged and different depth of cracks...
In order to take non-destructive detection for strips density in case, an X-ray non-destructive automatic detection system is established. Based on the principle of X-ray ionization radiation, when the X-ray interaction with the material, the phenomenon of scattering and photoelectric absorption occurs, the X-ray transmission intensity will be reduced. Through detecting the X-ray transmission intensity,...
Compared with the conventional high electron mobility transistor (HEMT), the metal-insulator-semiconductor (MIS)-HEMT has several advantages such as lower gate leakage current, higher maximum saturation drain current and the better restrain of current collapse. This paper studied the effects of temperature and the thickness of dielectric on the characteristics of Al2O3 MIS-HEMT. The device characteristics...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.