Search results for: M. Yoshimura
2015 IEEE International Electron Devices Meeting (IEDM) > 7.7.1 - 7.7.4
IET Micro & Nano Letters > 2012 > 7 > 4 > 343 - 347
2015 IEEE International Electron Devices Meeting (IEDM) > 7.7.1 - 7.7.4
IET Micro & Nano Letters > 2012 > 7 > 4 > 343 - 347