Search results for: V. P. Karikh
Russian Journal of Nondestructive Testing > 2019 > 55 > 4 > 322-327
Russian Journal of Nondestructive Testing > 2016 > 52 > 10 > 569-575
Optoelectronics, Instrumentation and Data Processing > 2012 > 48 > 6 > 574-579
Optoelectronics, Instrumentation and Data Processing > 2008 > 44 > 1 > 69-74