Search results for: V. V. Titkov
Optoelectronics, Instrumentation and Data Processing > 2017 > 53 > 6 > 583-590
Optoelectronics, Instrumentation and Data Processing > 2017 > 53 > 3 > 237-244
Journal of Applied Mechanics and Technical Physics > 2017 > 58 > 3 > 425-434
Russian Electrical Engineering > 2017 > 88 > 5 > 274-279
Russian Journal of Nondestructive Testing > 2016 > 52 > 4 > 185-196
Optoelectronics, Instrumentation and Data Processing > 2015 > 51 > 2 > 124-133
Physical Mesomechanics > 2015 > 18 > 3 > 261-272
Optoelectronics, Instrumentation and Data Processing > 2014 > 50 > 2 > 139-147
Optoelectronics, Instrumentation and Data Processing > 2014 > 50 > 1 > 61-67
Optoelectronics, Instrumentation and Data Processing > 2013 > 49 > 2 > 155-163
Technical Physics > 2013 > 58 > 10 > 1397-1403
IEEE Transactions on Plasma Science > 2010 > 38 > 8-1 > 1726 - 1730
Journal of Applied Mechanics and Technical Physics > 2003 > 44 > 1 > 129-134