The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
As technology scales, small and dense geometries, and process variations introduce defects that are often not detected by single stuck-at tests. To improve defect coverage, we expand the single stuck-at tests to cover multiple stuck-at faults. This paper investigates multiple stuck-at fault (MSAF) testability of ROBDD (Reduced Ordered Binary Decision Diagram) based fully delay testable combinational...
In this paper, we extend Modular Horner Expansion Diagram (Modular-HED) as a canonical polynomial representation to verify polynomial functions with multiple bit-width operands from Z2n1 × Z2n2… × Z2nd to Z2n. Our contributions are mostly in efficient implementation of [1] with a canonical decision diagram in such a way that both verification and synthesis of large arithmetic circuits can be more...
This paper proposes a non-scan gate-level Automatic Test Pattern Generation (ATPG) methodology which keeps the regularity in the arithmetic operations while reasoning about these operations for generating high-level test patterns from only faulty behavior of the design. Then by considering generated high-level test patterns as constraints and passing them to a SMT-solver we are able to automatically...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.