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A 1.02nW current reference is designed with only PMOS transistors, thereby providing inherently low process variation and enabling trim-free operation. Thirty-two measured chips from 5 corner wafers in 180nm CMOS technology show an untrimmed within-wafer spread (σ/μ) of 1.6% and across-corner wafer-to-wafer spread of ±4.7%. The measured average temperature coefficient is 282ppm/°C from −40°C to 120°C...
Physically Unclonable Functions (PUFs) are among the most promising security primitives for low cost solutions of key storage, chip authentication, and supply chain protection. Two types of PUFs exist in literature [1–6], a “strong” PUF with a large challenge-response space [6] and a “weak” PUF providing a limited length key (chip ID) [1–5]. While the former provides better security theoretically,...
The mismatch of current sources is caused by the circuit error and the process variation. Introducing the channel length modulation λ to the Pelgrom model for variation analysis, we describe a new ΔI/I model of current sources. To make it clear what variation parameter influences the mismatch, we implemented a test chip on 90nm process technology, where we can collect the characteristics variation...
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