Search results for: A. V. Lapko
Measurement Techniques > 2019 > 62 > 5 > 383-389
Measurement Techniques > 2019 > 62 > 4 > 300-306
Optoelectronics, Instrumentation and Data Processing > 2019 > 55 > 3 > 230-236
Measurement Techniques > 2019 > 62 > 1 > 16-22
Measurement Techniques > 2019 > 61 > 10 > 979-986
Optoelectronics, Instrumentation and Data Processing > 2018 > 54 > 5 > 451-456
Measurement Techniques > 2018 > 61 > 6 > 540-545
Measurement Techniques > 2018 > 61 > 5 > 427-433
Pattern Recognition and Image Analysis > 2018 > 28 > 1 > 11-16
Measurement Techniques > 2017 > 60 > 6 > 515-522
Measurement Techniques > 2017 > 60 > 4 > 325-330
Measurement Techniques > 2016 > 59 > 6 > 571-576
Measurement Techniques > 2016 > 59 > 2 > 122-126
Optoelectronics, Instrumentation and Data Processing > 2015 > 51 > 4 > 372-377
Measurement Techniques > 2015 > 58 > 5 > 485-490
Optoelectronics, Instrumentation and Data Processing > 2014 > 50 > 4 > 383-388
Optoelectronics, Instrumentation and Data Processing > 2014 > 50 > 1 > 68-74
Optoelectronics, Instrumentation and Data Processing > 2014 > 50 > 2 > 148-153
Measurement Techniques > 2014 > 57 > 3 > 222-227
Measurement Techniques > 2014 > 57 > 7 > 740-744