Search results for: H. Lin
IEEE Electron Device Letters > 2017 > 38 > 9 > 1224 - 1227
2016 IEEE International Electron Devices Meeting (IEDM) > 35.6.1 - 35.6.4
2015 IEEE International Electron Devices Meeting (IEDM) > 8.4.1 - 8.4.4
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 322 - 326
2012 International Electron Devices Meeting > 3.3.1 - 3.3.4
2010 International Electron Devices Meeting > 14.6.1 - 14.6.4
2008 IEEE Sensors > 1584 - 1587
2007 7th IEEE Conference on Nanotechnology (IEEE NANO) > 1309 - 1312
IEEE Electron Device Letters > 2007 > 28 > 7 > 596 - 598