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Capacitance mismatch can be generally attributed two sources of errors: random mismatch and systematic mismatch. Random mismatch is caused by the process variation, while systematic mismatch is mainly due to asymmetrical layout and processing gradients. Common centroid structure may reduce the systematic mismatch, but not the random mismatch. Based on spatial correlation model, this study derives...
<para> Random fluctuations in process conditions change the physical properties of parameters on a chip. The correlation of device parameters depends on spatial locations. In general, the closer devices most likely have the similar parameter variation. The key performance of many analog circuits is directly related to accurate capacitance ratios. Parallel unit capacitances have a great effect...
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