Search results for: R. D. Tikhonov
Semiconductors > 2017 > 51 > 13 > 1707-1708
Measurement Techniques > 2017 > 60 > 8 > 831-838
Russian Microelectronics > 2017 > 46 > 2 > 95-104
Russian Microelectronics > 2015 > 44 > 2 > 101-113
Russian Microelectronics > 2015 > 44 > 7 > 487-491
Measurement Techniques > 2013 > 56 > 3 > 309-313
Russian Microelectronics > 2013 > 42 > 7 > 378-383
Russian Microelectronics > 2013 > 42 > 4 > 220-229
Measurement Techniques > 2009 > 52 > 12 > 1344-1350
Measurement Techniques > 2009 > 52 > 4 > 410-415
Measurement Techniques > 2008 > 51 > 8 > 896-902
Measurement Techniques > 2007 > 50 > 7 > 763-769
Measurement Techniques > 2007 > 50 > 1 > 78-84
Measurement Techniques > 2006 > 49 > 11 > 1125-1133
Measurement Techniques > 2005 > 48 > 2 > 186-193
Russian Microelectronics > 2005 > 34 > 3 > 160-172
Measurement Techniques > 2004 > 47 > 9 > 926-931
Russian Microelectronics > 2004 > 33 > 6 > 377-380
Russian Microelectronics > 2004 > 33 > 4 > 224-235