Search results for: Geunho Cho
Integration, the VLSI Journal > 2016 > 54 > C > 97-108
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 234 - 244
Journal of Electronic Testing > 2013 > 29 > 3 > 261-273
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 263 - 272