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A technique is proposed for controlling the temporal instability of the dielectric parameters of ferroelectrics, which allows the critical number of polarization switching cycles to be calculated. The technique makes it possible to exclude the metrological failure of functional electronic elements based on the investigated materials because of their dielectric fatigue.
Modifications of the Sawyer-Tower method, based on a measurement of the impedance and Fourier transformations, are proposed. A functional and metrological analysis of the methods is presented, which enables the reliability of the measurements of the field dependences of the parameters of ferroelectric materials to be increased, which should find application in microelectronic and nanoelectronic products.
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