Search results for: A. P. Lapsar
Optoelectronics, Instrumentation and Data Processing > 2010 > 46 > 3 > 229-236
Measurement Techniques > 2010 > 53 > 6 > 605-614
Optoelectronics, Instrumentation and Data Processing > 2009 > 45 > 1 > 30-36
Measurement Techniques > 2009 > 52 > 3 > 215-219
Measurement Techniques > 2009 > 52 > 3 > 237-249
Measurement Techniques > 2008 > 51 > 6 > 582-589
Measurement Techniques > 2007 > 50 > 12 > 1240-1242
Measurement Techniques > 2007 > 50 > 3 > 233-236
Measurement Techniques > 2006 > 49 > 4 > 332-340
Measurement Techniques > 2005 > 48 > 12 > 1167-1170
Cybernetics and Systems Analysis > 2004 > 40 > 1 > 66-74
Measurement Techniques > 2004 > 47 > 2 > 121-127