Search results for: Javier Díaz
IEEE Electron Device Letters > 2014 > 35 > 4 > 479 - 481
IEEE Transactions on Instrumentation and Measurement > 2014 > 63 > 7 > 1753 - 1759
IEEE Electron Device Letters > 2014 > 35 > 4 > 479 - 481
IEEE Transactions on Instrumentation and Measurement > 2014 > 63 > 7 > 1753 - 1759