Search results for: Daiki Hirabayashi
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 6 > 1145 - 1149
Journal of Electronic Testing > 2013 > 29 > 6 > 879-892
2011 International SoC Design Conference > 146 - 149
Odontology > 1997 > 85 > 3 > 497-503