Search results for: I. D. Loshkarev
Semiconductors > 2019 > 53 > 4 > 503-510
Technical Physics Letters > 2018 > 44 > 7 > 562-565
Optoelectronics, Instrumentation and Data Processing > 2018 > 54 > 2 > 181-186
Bulletin of the Russian Academy of Sciences: Physics > 2018 > 82 > 5 > 567-569
Russian Physics Journal > 2018 > 60 > 11 > 1864-1870
Semiconductors > 2018 > 52 > 3 > 390-393
Bulletin of the Russian Academy of Sciences: Physics > 2017 > 81 > 5 > 598-601
Russian Physics Journal > 2017 > 60 > 2 > 354-359
Technical Physics Letters > 2017 > 43 > 2 > 213-215
Physics of the Solid State > 2015 > 57 > 11 > 2151-2158
Russian Physics Journal > 2015 > 58 > 7 > 965-969
Bulletin of the Russian Academy of Sciences: Physics > 2015 > 79 > 6 > 763-766
Russian Microelectronics > 2015 > 44 > 8 > 552-558
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques > 2014 > 8 > 4 > 647-650
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques > 2014 > 8 > 3 > 502-508
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques > 2014 > 8 > 4 > 641-646
Bulletin of the Russian Academy of Sciences: Physics > 2014 > 78 > 4 > 307-310
Russian Physics Journal > 2013 > 56 > 1 > 55-61
Bulletin of the Russian Academy of Sciences: Physics > 2013 > 77 > 3 > 233-235
Bulletin of the Russian Academy of Sciences: Physics > 2012 > 76 > 3 > 325-327