Search results for: V. V. Emtsev
Semiconductors > 2018 > 52 > 13 > 1677-1685
Semiconductors > 2018 > 52 > 7 > 942-949
Semiconductors > 2017 > 51 > 12 > 1571-1587
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques > 2017 > 11 > 3 > 601-605
Technical Physics Letters > 2016 > 42 > 11 > 1079-1082
Semiconductors > 2016 > 50 > 10 > 1291-1298
Technical Physics Letters > 2016 > 42 > 7 > 701-703
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques > 2014 > 8 > 5 > 950-952
Semiconductors > 2014 > 48 > 11 > 1438-1443
Semiconductors > 2014 > 48 > 12 > 1552-1556
Journal of Materials Science: Materials in Electronics > 2007 > 18 > 7 > 701-704
Journal of Materials Science: Materials in Electronics > 2007 > 18 > 7 > 711-714
Journal of Applied Spectroscopy > 2006 > 73 > 1 > 95-98
Journal of Materials Science: Materials in Electronics > 2001 > 12 > 4-6 > 223-225