Search results for: A. Kuno
Microelectronics Reliability > 2017 > 76-77 > C > 405-408
Microelectronics Reliability > 2016 > 64 > C > 287-293
ICAME 2003 > Earth Sciences, Mineralogy and Archaeology > 431-437
Microelectronics Reliability > 2015 > 55 > 7 > 1060-1066
Microelectronics Reliability > 2014 > 54 > 9-10 > 1867-1871
Microelectronics Reliability > 2013 > 53 > 9-11 > 1543-1547
Journal of Volcanology and Geothermal Research > 2008 > 178 > 2 > 145-168
Solid State Ionics > 2008 > 179 > 21-26 > 1000-1003
Journal of Radioanalytical and Nuclear Chemistry > 2008 > 278 > 2 > 495-498
Journal of Radioanalytical and Nuclear Chemistry > 2008 > 278 > 2 > 331-335
Basic Research in Cardiology > 2007 > 102 > 1 > 73-79