Search results for: H.Y. Yu
2012 IEEE International Reliability Physics Symposium (IRPS) > MY.4.1 - MY.4.4
2011 International Electron Devices Meeting > 9.7.1 - 9.7.4
2011 International Electron Devices Meeting > 31.2.1 - 31.2.4
2011 International Electron Devices Meeting > 2.6.1 - 2.6.4
2011 International Electron Devices Meeting > 12.3.1 - 12.3.4
IEEE Electron Device Letters > 2010 > 31 > 4 > 335 - 337
IEEE Electron Device Letters > 2009 > 30 > 7 > 754 - 756
IEEE Electron Device Letters > 2008 > 29 > 1 > 50 - 53
IEEE Electron Device Letters > 2008 > 29 > 1 > 34 - 37