Search results for: ChangHwan Shin
Solid State Electronics > 2011 > 65-66 > Complete > 184-190
2010 IEEE International Reliability Physics Symposium > 1117 - 1121
IEEE Transactions on Electron Devices > 2010 > 57 > 6 > 1301 - 1309
Solid State Electronics > 2011 > 65-66 > Complete > 184-190
2010 IEEE International Reliability Physics Symposium > 1117 - 1121
IEEE Transactions on Electron Devices > 2010 > 57 > 6 > 1301 - 1309