Search results for: ChangHwan Shin
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 19 - 22
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5270 - 5273
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4974 - 4979
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4025 - 4030
IEEE Journal of the Electron Devices Society > 2017 > 5 > 5 > 306 - 309
IEEE Electron Device Letters > 2017 > 38 > 5 > 669 - 672
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2452 - 2456
IEEE Journal of the Electron Devices Society > 2017 > 5 > 3 > 232 - 236
IEEE Electron Device Letters > 2017 > 38 > 4 > 418 - 421
IEEE Transactions on Electron Devices > 2016 > 63 > 12 > 5048 - 5054
IEEE Transactions on Electron Devices > 2016 > 63 > 12 > 4617 - 4623
IEEE Transactions on Electron Devices > 2016 > 63 > 12 > 5030 - 5035
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4167 - 4172
IEEE Electron Device Letters > 2016 > 37 > 11 > 1383 - 1386
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3338 - 3341
2016 IEEE Silicon Nanoelectronics Workshop (SNW) > 174 - 175
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1827 - 1834
IEEE Electron Device Letters > 2016 > 37 > 3 > 245 - 248
IEEE Electron Device Letters > 2016 > 37 > 6 > 705 - 708