Search results for: P. Linder
2016 IEEE International Electron Devices Meeting (IEDM) > 15.4.1 - 15.4.4
IEEE Electron Device Letters > 2015 > 36 > 12 > 1274 - 1276
IEEE Transactions on Electron Devices > 2015 > 62 > 7 > 2148 - 2154
2013 IEEE International Reliability Physics Symposium (IRPS) > 4C.4.1 - 4C.4.4
2011 International Reliability Physics Symposium > 2B.4.1 - 2B.4.4
2011 International Reliability Physics Symposium > 4A.3.1 - 4A.3.9