Search results for: Takahiro J. Yamaguchi
IEEE Journal of Solid-State Circuits > 2012 > 47 > 11 > 2701 - 2710
IEEE Asian Solid-State Circuits Conference 2011 > 201 - 204
Journal of Electronic Testing > 2003 > 19 > 2 > 183-193
IEEE Journal of Solid-State Circuits > 2012 > 47 > 11 > 2701 - 2710
IEEE Asian Solid-State Circuits Conference 2011 > 201 - 204
Journal of Electronic Testing > 2003 > 19 > 2 > 183-193