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IEEE Electron Device Letters > 2017 > 38 > 11 > 1528 - 1531
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4167 - 4174
IEEE Transactions on Magnetics > 2017 > 53 > 10 > 1 - 16
IEEE Electron Device Letters > 2017 > 38 > 9 > 1244 - 1247
IEEE Transactions on Magnetics > 2017 > 53 > 4-1 > 1 - 6
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1224 - 1235
IEEE Transactions on Reliability > 2016 > 65 > 4 > 1755 - 1768
IEEE Transactions on Circuits and Systems I: Regular Papers > 2016 > 63 > 12 > 2139 - 2148
IEEE Transactions on Circuits and Systems I: Regular Papers > 2016 > 63 > 8 > 1255 - 1264
IEEE Transactions on Cybernetics > 2016 > 46 > 6 > 1301 - 1310
IEEE Transactions on Power Electronics > 2016 > 31 > 3 > 2476 - 2484
IEEE Transactions on Industrial Electronics > 2016 > 63 > 2 > 849 - 863
IEEE Transactions on Industrial Informatics > 2015 > 11 > 6 > 1358 - 1365
IEEE Electron Device Letters > 2015 > 36 > 11 > 1146 - 1148
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 2972 - 2977
IEEE Electron Device Letters > 2015 > 36 > 6 > 567 - 569
IEEE Transactions on Electron Devices > 2015 > 62 > 6 > 1998 - 2006
IEEE Transactions on Electron Devices > 2015 > 62 > 5 > 1498 - 1503
IEEE Journal of the Electron Devices Society > 2015 > 3 > 3 > 158 - 163
IEEE Transactions on Electron Devices > 2015 > 62 > 2 > 666 - 672