Search results for: . .
IEEE Electron Device Letters > 2017 > 38 > 9 > 1244 - 1247
IEEE Transactions on Circuits and Systems I: Regular Papers > 2016 > 63 > 8 > 1255 - 1264
2016 IEEE International Reliability Physics Symposium (IRPS) > 7B-3-1 - 7B-3-5
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 2972 - 2977
IEEE Electron Device Letters > 2015 > 36 > 6 > 567 - 569
IEEE Electron Device Letters > 2014 > 35 > 10 > 1019 - 1021