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IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 10 > 2736 - 2744
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 7 > 1831 - 1836
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 7 > 1719 - 1727
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1475 - 1481
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1482 - 1488
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1467 - 1474
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1560 - 1565
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1489 - 1495
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1459 - 1466
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1248 - 1253
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1095 - 1102
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1237 - 1242
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 2 > 305 - 314
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1243 - 1247
IEEE Transactions on Instrumentation and Measurement > 2016 > 65 > 12 > 2758 - 2772
IEEE Transactions on Instrumentation and Measurement > 2016 > 65 > 9 > 2101 - 2107
IEEE Transactions on Instrumentation and Measurement > 2016 > 65 > 9 > 2137 - 2144
IEEE Transactions on Instrumentation and Measurement > 2016 > 65 > 5 > 1042 - 1050
IEEE Transactions on Instrumentation and Measurement > 2016 > 65 > 1 > 222 - 230
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 12 > 3451 - 3457