Search results for: Takehiko Oe
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1475 - 1481
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1482 - 1488
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1560 - 1565
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1237 - 1242
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1446 - 1450
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1490 - 1495
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1514 - 1519
IEEE Transactions on Instrumentation and Measurement > 2013 > 62 > 6 > 1450 - 1453
IEEE Transactions on Instrumentation and Measurement > 2013 > 62 > 6 > 1755 - 1759
IEEE Transactions on Instrumentation and Measurement > 2013 > 62 > 6 > 1776 - 1782
IEEE Transactions on Instrumentation and Measurement > 2013 > 62 > 6 > 1743 - 1748