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Space charge measurement in very thin dielectric films constitutes the new challenge for the conventional space charge measurement methods. Due to their limited spatial resolution, they cannot be used so far. The Electro-Acoustic Reflectometry has shown the possibility to break this limit. In this article, its sensitivity is investigated. We show that it is possible to recover the information even...
One of the challenges in the area of space charge measurements in dielectric materials is reaching a high spatial resolution without destroying the sample. In this work we propose a new method: Electro-Acoustic Reflectometry (EAR). It measures reflection from the sample when stressed by voltage and deals with signals in frequency domain. It is tested on a 9 µm thick PVDF sample. The primary obtained...
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