Wyniki wyszukiwania dla: N. Miroshnikova
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques > 2019 > 13 > 5 > 832-835
Semiconductors > 2019 > 53 > 6 > 784-788
Russian Microelectronics > 2018 > 47 > 8 > 624-627
Semiconductors > 2018 > 52 > 2 > 231-235
Measurement Techniques > 2015 > 58 > 2 > 167-172
Semiconductors > 2013 > 47 > 8 > 1018-1025
Measurement Techniques > 2011 > 54 > 6 > 712-715
Measurement Techniques > 2010 > 53 > 6 > 620-625